US 6,472,663 B2 · Electron microscope

Abstract

Relationship among an exciting current of each lens of an irradiation lens system including at least two stages of irradiation lenses and an electron beam aperture, an irradiation electron beam density on a sample and an area of the sample surface irradiated with an electron beam is stored in a form of a table or equations, and an exciting condition of each of the lenses of the irradiation lens system is retrieved from the relationship and set the irradiation lens system to the retrieved condition, for example, when the enlarging magnification is changed under a condition of keeping the irradiation electron beam density at a constant value. Further, trails of a region of the sample surface irradiated with the electron beam is displayed on a display unit.

Claims4

Dependent claims

An electron microscope comprising irradiation lenses and a sample fine movement apparatus, and a sample surface being irradiated with an electron beam focused by the lenses, which further comprises:

means for causing said electron microscope to irradiate each of a plurality of coordinates of the sample surface with a quantity of radiation from the electron beam based on information on the region irradiated with the electron beam and sample position information for that coordinate from the sample fine movement apparatus;
and
means for displaying a locus of regions on the sample surface irradiated with the electron beam based on said information on the region irradiated with the electron beam and sample position information from the sample fine movement apparatus, the irradiated regions being displayed so as to be distinguishable from other regions on the sample surface.

Dependencies are inferred from the claim text.

Electron microscope

Life of this patent

Electron microscope

Life of this patent

Abstract

Claims4