Phthalocyanine compounds, process for production thereof and electrophotographic photosensitive member using the compounds
AssigneeCanon Kabushiki Kaisha
InventorMasato Tanaka
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AssigneeCanon Kabushiki Kaisha
InventorMasato Tanaka
Estimating the term…
Iodogallium phthalocyanine and bromogallium phthalocyanine having novel crystalline forms characterized by X-ray diffraction patterns according to CuKα characteristic X-ray diffraction method and exhibiting excellent sensitivity can be obtained through appropriate selection of a reaction solvent, followed by milling or stirring in an appropriate solvent. For example, α-chloronaphthalene is a suitable solvent for reaction between phthalonitrile and gallium triiodide or tribromide to provide iodogallium phthalocyanine or bromogallium phthalocyanine. Reaction of chlorogallium phthalocyanine or hydroxygallium phthalocyanine with hydroiodic (or hydrobromic) acid is also effective for providing a novel crystal form of iodo- (or bromo-) gallium phthalocyanine. Zirconium phthalocyanine exhibiting good electrophotographic performances can be obtained through a similar process.
Iodogallium phthalocyanine having a crystal form selected from those characterized by X-ray diffraction patterns (a)-(e) shown below respectively obtained by a CuKα characteristic X-ray diffraction method:
A process for producing iodogallium phthalocyanine, comprising:
Bromogallium phthalocyanine having a crystal form selected from those represented by X-ray diffraction patterns (g)-(j) shown below respectively obtained by a CuKα characteristic X-ray diffraction method:
Dihydroxyzirconium phthalocyanine having a crystal form represented by an X-ray diffraction pattern having a strongest peak at a Bragg angle (2θ±0.2 deg.) in a range of 7.0-9.0 deg. as measured by a CuKα characteristic X-ray diffraction method.
A process for producing dihydroxyzirconium phthalocyanine having a crystal form represented by an X-ray diffraction pattern having a strongest peak at a Bragg angle (2θ±0.2 deg.) in a range of 7.0-9.0 deg. as measured by a CuKα characteristic X-ray diffraction method,
Dependencies are inferred from the claim text.