X-ray examination device and method for producing undistorted X-ray images
AssigneeKoninklijke Philips Electronics N.V.
InventorsWaldermar Zylka, Jorg Sabczynski, Jürgen Weese
Life of this patent
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Abstract
In an X-ray examination device and a method for generating distortion-free X-ray images the imaging properties are calculated and distortions are corrected by providing at least one calibration member (7, 8) for forming a reference pattern; a correction unit (13) corrects the distortions in X-ray images on the basis of the pattern of the calibration members (7, 8) actually formed in the patient X-ray image (FIG. 4) and the calculated reference pattern.
Claims6
An X-ray examination apparatus including an image processing unit, comprising:
- first and second calibration members constructed to be transparent to x-rays, in disc-form and arranged in an X-ray beam path of the x-ray examination apparatus;
- a position measuring device for detecting a spatial relationship between the first and second calibration members, where the image processing unit forms a reference pattern based on said detected spatial relationship;
- and
- a correction unit for correcting distortions in an X-ray image having a patient image and the reference pattern on the basis of the reference pattern.
An X-ray examination apparatus comprising:
- a first calibration member provided on an x-ray source;
- a second calibration member provided on an x-ray image intensifier;
- a position measuring device for measuring a position of said first and second calibration member as arranged on said X-ray source and said x-ray image intensifier, respectively;
- an arithmetic unit for calculating a reference pattern from known dimensions of said X-ray examination apparatus and the measured positions of said first and second calibration members;
- a correction unit for correcting distortions in an X-ray image having a patient image and the reference pattern on the basis of the reference pattern;
- and
- a display unit for displaying the X-ray image.
A method of forming distortion-free X-ray images, said method comprising:
- providing first and second calibration members in a path of an x-ray beam at measured first and second respective positions;
- calculating a reference pattern associated with the at least one of said first and second calibration members based on said measured first and second positions;
- forming an X-ray image including a patient image and the reference pattern;
- and
- correcting distortions of the patient image on the basis of the reference pattern.
An X-ray examination apparatus for providing an X-ray image including a patient image, comprising:
- a first calibration member for forming a first reference pattern in the X-ray image;
- a second calibration member for forming a second reference pattern in the X-ray image;
- and
- a correction unit for correcting any distortions of the patent image in the X-ray image on a basis of a positional relationship of the first calibration member and the second calibration member.
A method of providing an X-ray image including a patient image without any distortions, said method comprising:
- calculating a positional relationship of a first calibration member and a second calibration member;
- forming the X-ray image including the patient image, a first reference pattern formed by the first calibration member, and a second reference pattern formed by the second calibration member;
- and
- correcting any distortions of the patent image in the X-ray image on a basis of the positional relationship of the first calibration member and the second calibration member.
Dependencies are inferred from the claim text.