DRAM sense amplifier having pre-charged transistor body nodes
AssigneeMicron Technology, Inc.
InventorGreg A. Blodgett
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AssigneeMicron Technology, Inc.
InventorGreg A. Blodgett
Estimating the term…
A DRAM sense amplifier that reduces the leakage current through the sense amplifier circuitry while the array is active, while controlling the body voltage of the sense amplifier transistors to improve performance of the sense amplifier circuitry is disclosed. The body nodes of the sense amplifier transistors are pre-charged to a voltage potential, such as for example Vcc/2. The body nodes are disconnected from the pre-charge voltage while the sense amplifier is enabled, i.e., during an access operation, but the threshold voltage Vt of the sense amplifier transistors will be lower during sensing due to the pre-charge level. As the body potential drops during sensing, the threshold voltage Vt will increase, thereby reducing the leakage current that flows through the sense amplifier while the digit lines are separated.
A sense amplifier comprising:
A sense amplifier for a memory device comprising:
A sense amplifier comprising:
A sense amplifier comprising:
A memory device comprising:
A memory device formed on a substrate, said memory device comprising:
A memory device formed on a substrate, said memory device comprising:
A processor system comprising:
A method for operating a sense amplifier, said sense amplifier including an amplifier circuit having a plurality of transistors, each of said plurality of transistors having a body node, said method comprising the steps of:
A method for operating a sense amplifier, said sense amplifier including a first and second amplifier circuit, each of said first and second amplifier circuits having a plurality of transistors, each of said plurality of transistors having a body node, said method comprising the steps of:
Dependencies are inferred from the claim text.