Electron beam apparatus and image-forming apparatus
AssigneeCanon Kabushiki Kaisha
InventorsIchiro Nomura, Masato Yamanobe, Hidetoshi Suzuki, Toshihiko Takeda, Tatsuya Iwasaki
Life of this patent
Estimating the term…
Loading patent…
AssigneeCanon Kabushiki Kaisha
InventorsIchiro Nomura, Masato Yamanobe, Hidetoshi Suzuki, Toshihiko Takeda, Tatsuya Iwasaki
Estimating the term…
In an electron beam apparatus comprising an enclosure in which an electron-emitting device having an electron-emitting region between opposite electrodes is disposed, the electron-emitting device exhibits such a characteristic as that an emission current is uniquely determined with respect to a device voltage. The interior of the enclosure is maintained under an atmosphere effective to prevent structural changes of the electron-emitting device. An image-forming apparatus comprises an enclosure in which an electron source and an image-forming member are disposed, the electron source comprising the above electron-emitting device. An emission current is stable with a very small change in the amount of electrons emitted, a sharp image is produced with high contrast, and gradation control is easily carried out.
An electron beam apparatus, comprising an enclosure in which an electron-emitting device including an electron-emitting region is disposed, wherein an interior of said enclosure is maintained under an atmosphere in which a pulse-width-dependent variation of a peak emission current of the electron-emitting device is not greater than 5%, wherein the electron-emitting device comprises a surface conduction electron-emitting device.
An electron beam apparatus, comprising an enclosure in which an electron-emitting device including an electron-emitting region is disposed, wherein an interior of said enclosure is maintained under an atmosphere in which a pulse-width-dependent variation of a peak emission current of the electron-emitting device is not greater than 5%, wherein the electron-emitting device exhibits a characteristic in which an emission current is uniquely determined with respect to a device voltage.
An electron beam apparatus, comprising an enclosure in which an electron-emitting device including an electron-emitting region is disposed, wherein an interior of said enclosure is maintained under an atmosphere in which a pulse-width-dependent variation of a peak emission current of the electron-emitting device is not greater than 5%, wherein the electron-emitting device exhibits a characteristic in which a device current is uniquely determined with respect to a device voltage.
An electron beam apparatus, comprising:
An electron beam apparatus, comprising an enclosure in which an electron-emitting device including an electron-emitting region is disposed, wherein an interior of said enclosure is maintained under an atmosphere in which a pulse-width-dependent variation of a peak emission current of the electron-emitting device is not greater than 5%, wherein the atmosphere is effective to prevent materials containing carbon as a main ingredient from depositing on the electron-emitting device.
An electron beam apparatus, comprising an enclosure in which an electron-emitting device including an electron-emitting region is disposed, wherein an interior of said enclosure is maintained under an atmosphere in which a pulse-width-dependent variation of a peak emission current of the electron-emitting device is not greater than 5%, further comprising a modulator for modulating electron beams emitted from the electron-emitting device.
An electron beam apparatus, comprising an enclosure in which an electron-emitting device including an electron-emitting region is disposed, wherein an interior of said enclosure is maintained under an atmosphere in which a pulse-width-dependent variation of a peak emission current of the electron-emitting device is not greater than 5%, further comprising a modulation signal generator for applying a modulation signal to the electron-emitting device.
An electron beam apparatus, comprising an enclosure in which an electron-emitting device including an electron-emitting region is disposed, wherein an interior of said enclosure is maintained under an atmosphere in which a pulse-width-dependent variation of a peak emission current of the electron-emitting device is not greater than 5%, wherein a modulation signal with varying pulse widths is applied to the electron-emitting device.
An electron beam apparatus, comprising an enclosure in which an electron-emitting device including an electron-emitting region is disposed, wherein an interior of said enclosure is maintained under an atmosphere in which a pulse-width-dependent variation of a peak emission current of the electron-emitting device is not greater than 5%, wherein a modulation signal with varying voltages is applied to the electron-emitting device.
An electron beam apparatus, comprising:
An electron beam apparatus, comprising:
An electron beam apparatus, comprising:
An electron beam apparatus, comprising:
An electron beam apparatus, comprising:
An electron beam apparatus, comprising:
An electron beam apparatus, comprising:
An electron beam apparatus, comprising:
An electron beam apparatus, comprising:
Dependencies are inferred from the claim text.