Linear measuring machine
AssigneeMitutoyo Corporation
InventorsYuwu Zhang, Masaoki Yamagata, Hiroyuki Tokito, Yoichi Nomura, Bunji Aoyama
Life of this patent
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Abstract
A linear measuring machine is provided, the linear measuring machine having a base (11), a column (12) disposed on the base, a slider (14) elevatable along the column and an elevation driving mechanism (44) including a motor for lifting and lowering the slider. The linear measuring machine further includes a touch-and-back mechanism for driving the elevation driving mechanism in a direction for a probe (13) to move away from a measurement surface of the workpiece after fetching a detection value of a displacement sensor (45) when the probe touches the measurement surface of the workpiece and for stopping the elevation driving mechanism.
Claims3
A linear measuring machine, comprising:
- a base movably disposed on a surface plate;
- a column provided on the base;
- an elevation driving mechanism including a motor for lifting and lowering a slider having a probe;
- a displacement sensor for detecting a displacement of the slider in a height direction;
- a controller for fetching a detection value of the displacement sensor when the probe touches a measurement surface of a workpiece;
- and a display for displaying the detection value fetched by the controller,
- the controller including a touch-and-back mechanism for moving the probe in a direction away from the measurement surface of the workpiece after fetching the detection value of the displacement sensor when the probe touches the measurement surface of the workpiece and for stopping the slider, when the slider is lifted or lowered by driving the elevation driving mechanism, wherein the touch-and-back mechanism forcibly stops the slider when the probe keeps on retracting beyond the retraction target position and when a predetermined time passes after the probe is separated from the measurement surface of the workpiece.
Dependencies are inferred from the claim text.