Method for simulating electrical characteristics of electronic device
AssigneeSony Corporation
InventorTakaaki Tatsumi
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Abstract
There is provided a method for simulating the electrical characteristics of an electronic device including a step of specifying the material, electrical characteristics, and shape of a part of interest of the electronic device, the specification of the shape being performed by selecting it from among several preselected simplified shape models to obtain required data easily. Further, it is possible to reuse such data as input data for various simulators. The data can be accurately created in a shorter period of time.
Claims18
A method for simulating the electrical characteristics of an electronic device comprising the steps of:
- specifying the material of a part of interest of the electronic device;
- specifying the electrical characteristics of the part of interest of the electronic device;
- and
- specifying the shape of the part of interest of the electronic device, said specification of the shape being performed by selecting it from among several preselected simplified shape models.
An input data generation apparatus for simulation for generating input information required for simulating the electrical characteristics of a semiconductor device, comprising:
- a means for specifying the material, electrical characteristics, and shape of a part of interest of a semiconductor device, the specification of the shape being performed by selecting it from among several preselected simplified shape models as the input data for simulation.
An input data generation apparatus for simulation for generating input information required for simulating the electrical characteristics of a semiconductor device, comprising:
- a means for specifying the material of a part of a semiconductor device;
- a means for specifying the shape of the part of the semiconductor device;
- a means for specifying the electrical characteristics of the part of the semiconductor device;
- a means for specifying the shape of the part by selecting it from among several preselected simplified shape models;
- and
- a means for preparing the simplified shapes as mesh data in arbitrary steps for arithmetic processing thereon.
A method for simulating the electrical characteristics of a semiconductor device, comprising the steps of:
- specifying the material of a part of interest of a semiconductor device;
- specifying the shape of the part of interest of the semiconductor device;
- specifying the electrical characteristics of the part of interest of the semiconductor device;
- specifying the shape by selecting it from among several preselected simplified shape models;
- and
- defining an overall shape using said specified shapes which are overlapped in a certain order.
Dependencies are inferred from the claim text.