Back to results
US 6,446,019 B1Granted
Method and apparatus for calibrating analog sensor measurement
AssigneeIntel Corporation
InventorsVirgil Niles Kynett, Steven E. Wells
Life of this patent
Estimating the term…
Abstract
A method for calibrating analog sensor measurements within a computer system is disclosed. The method includes the steps of generating an analog sensor measurement result, reading at least two values that define a curve from a memory device, and calculating a calibrated result using the analog sensor measurement result and the values that define the curve.
Claims6
An apparatus, comprising:
- at least two non-volatile memory locations that store values that define a line, wherein the first memory location stores a slope of the line and the second memory location stores an intercept of the line;
- an input to receive a sensor measurement value;
- and
- a calculation circuit to calculate a calibrated measurement result using the values that define the line and the sensor measurement value, wherein the calibrated measurement is produced according to the formula y=m*x+b, wherein m represents the slope, b represents the intercept, x represents the analog sensor measurement result, and y represents the calibrated result.
1 more element
A system, comprising:
- an input/output circuit;
- a calculation circuit coupled to the input/output circuit;
- and
- a first non-volatile memory location and a second non-volatile memory location coupled to the calculation circuit, wherein the first non-volatile memory location stores a slope of a line and the second non-volatile memory location stores an intercept of the line.
1 more element
Dependencies are inferred from the claim text.