Statistical process control integration systems and methods for monitoring manufacturing processes
AssigneeCircuit Image Systems
InventorsJim Kenney, John Leon
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AssigneeCircuit Image Systems
InventorsJim Kenney, John Leon
Estimating the term…
A method and system for monitoring process parameters associated with a manufacturing or testing process. The system includes: at least one machine which is used in the manufacturing or testing process; at least one sensing device, coupled to the at least one machine, for measuring a process parameter associated with the at least one machine; and a controller, coupled to the at least one sensing device, for receiving and storing measured data from the at least one sensing device. The method includes the acts of: measuring a value of a process parameter associated with a machine used in the manufacturing or testing process; converting the measured value of the process parameter into a digital data signal having a specified data format; transmitting the digital data signal to a controller; and storing the digital data signal in a database.
A statistical process control integration system for monitoring and storing certifiable manufacturing process parameters associated with the manufacture of printed circuit board (PCB) manufacturing processes in use at multiple, geographically separate manufacturing sites comprising:
A statistical process control integration system for monitoring and storing certifiable manufacturing process parameters associated with the manufacture of printed circuit board (PCB) manufacturing processes in use at multiple, geographically separate manufacturing sites comprising:
A statistical process control integration system for monitoring and storing certifiable manufacturing process parameters associated with the manufacture of printed circuit board (PCB) manufacturing processes in use at multiple, geographically separate manufacturing sites comprising:
Dependencies are inferred from the claim text.