Illumination compensation system for industrial inspection
AssigneeSiemens Corporate Research, Inc.
InventorsShang-Hong Lai, Ming Fang
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AssigneeSiemens Corporate Research, Inc.
InventorsShang-Hong Lai, Ming Fang
Estimating the term…
An illumination compensation system for correcting smooth intensity variations due to illumination changes is based on an assumption that an underlining image reflectance function is approximately a piecewise constant and that an image irradiance function is spatially smooth. The system first takes the logarithm of an image brightness function. Gradient constraints are then computed using a finite difference. Reliable gradient constraints are selected based on a local uniformity test. A process is subsequently applied to estimate the logarithmic irradiance function. A logarithmic irradiance function is subtracted from the logarithmic image brightness function and an exponential operation of the above subtracted image function is taken and an illumination compensated image is outputted from the system.
A method for compensating for variations of illumination in an automatic visual inspection system, the method comprising the steps of:
A system for compensating for variations of illumination in an automatic visual inspection system, comprising:
A method for improving automatic visual inspection performance under varying illumination conditions, comprising the steps of:
A program storage device readable by a machine, tangibly embodying a program of instructions executable by the machine to perform method steps for compensating for variations of illumination in an automatic visual inspection system, the method steps comprising:
A program storage device readable by a machine, tangibly embodying a program of instructions executable by the machine to perform method steps for improving automatic visual inspection performance under varying illumination conditions, the method steps comprising:
Dependencies are inferred from the claim text.
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1. Field of the Invention
The resent invention relates to improving images for inspection purposes and more particularly to applying an illumination compensation to the images to correct smooth intensity variations due to illumination changes.
2. Description of the Prior Art
FIG. 1 illustrates a flow chart of the present invention.
FIG. 2 illustrates a square non-conforming finite element Ei,j that the element basis function is a second-order polynomial with coefficients determined by its neighboring nodal variables.
FIG. 3 illustrates (a) a reference image, (b) an inspection image, (c) a difference image without illumination compensation, and (d) a difference image with the illumination compensation system applied before image subtraction.
The image reference approach is very popular in industrial inspection due to its generality for different inspection tasks. Unfortunately, this approach is sensitive to illumination variations. The present invention provides an illumination compensation system for correcting smooth intensity variations due to illumination changes. By using the present invention as a pre-processing step in the image reference based inspection or localization, the image inspection or localization is made more robust against spatially smooth illumination changes.
The flow chart of the illumination compensation system of the present invention is shown in FIG. 1. The image brightness function is inputted to the take LOG operator 10 where the logarithm of the image brightness function is taken. Then in gradient constraints computer 12, the gradient constraints are computed using finite difference. In reliable constraints selector 14, reliable gradient constraints are selected based on a local uniformity test. In surface fitting processor 16, a process is subsequently applied to estimate the logarithmic irradiance function. In image subtractor 18, the logarithmic irradiance function is subtracted from the logarithmic image brightness function. Finally, in take exponential operator 20, the exponential operation of the above subtracted image function is taken and the illumination compensated image is outputted from the system.
The present invention is based on the assumption that the underlining image reflectance function is approximately a piecewise constant and that the image irradiance function is spatially smooth. Within reliable constraints selector 14, reliable gradient constraints on the smooth irradiance function are computed and selected from the image brightness function by using a local uniformity test. Within surface fitting processor 16, two surface fitting systems are presented to recover the smooth image irradiance function from the elected reliable gradient constraints found in gradient constraints computer 12. One is a polynomial surface fitting system and the other is a spline surface fitting system. The spline surface fitting formulation leads to solving a large linear system, which is accomplished by an efficient preconditioned conjugate gradient system. Once the image irradiance function is estimated, the spatial intensity inhomogeneities can be easily compensated.
No related US applications are recorded in the indexed filing history.
Industrial image inspection: using an image reference approach
Dynamic range modification of images or parts thereof: based on local image properties, e.g. for local contrast enhancement
Optical characteristics of the device performing the acquisition or on the illumination arrangements: illumination specially adapted for pattern…
Special mode during image acquisition: varying illumination
Term ended 22 Jan 2019 (estimated)
USPTO file history isn’t available for this patent, so only indexed dates are shown.