Semiconductor integrated circuit device having pseudo-tuning function
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsYasuhiro Matsumoto, Mikio Sakurai
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Abstract
The power supply tuning circuit in accordance with the present invention is provided with a plurality of power supply circuits. Each power supply circuit includes a latch circuit. The latch circuit records a tuning signal. The recorded tuning signal causes the corresponding transistor to switch on/off. In this manner, pseudo-tuning is performed. After a tuning signal is supplied to the latch circuit, the tuning signal is supplied to another power-supply circuit. Thus, pseudo-tuning can be preformed simultaneously for a plurality of power supply circuits.
Claims23
A semiconductor integrated circuit device, comprising:
- a plurality of power-supply generation means, each including a fuse for generating a desired internal voltage when being blown, latch means for latching tuning data for performing pseudo-tuning, and emulation means for emulating, in response to the data latched by said latch means, a blow state of said fuse to emulate outputting of the internal voltage;
- and
- a plurality of supply control means being disposed corresponding to said plurality of power-supply generation means respectively and each controlling supplying of said tuning data to a corresponding one of said power-supply generation means.
A semiconductor integrated circuit device, comprising:
- power-supply generation means including test mode designating means for detecting designation of a test mode in response to a test mode designating signal input from outside,
- data generation means for successively generating tuning data to perform pseudo-tuning in said test mode,
- a fuse for generating a desired internal voltage when being blown, and
- emulation means for emulating a blow state of said fuse to emulate outputting of the internal voltage.
A semiconductor integrated circuit device, comprising:
- a first voltage generation circuit connected to a power supply line to which a first external voltage is provided for generating an internal voltage;
- a comparing circuit for comparing a second external voltage with said internal voltage generated at an output node of said first voltage generation circuit;
- a latch circuit for latching data according to an output from said comparing circuit;
- and
- a second voltage generation circuit connected between said power supply line and said output node and controlled by data latched by said latch circuit.
A semiconductor device comprising:
- a power-supply circuit, wherein said power-supply circuit includes:
- a data holding circuit capable of holding a control signal;
- and
- a voltage generation circuit connected to a power supply line, down-converting a voltage at said power-supply line and outputting the down-converted voltage in response to an output of said data holding circuit.
Dependencies are inferred from the claim text.