IC tester and IC test method
AssigneeAndo Electric Co., Ltd.
InventorShigehiro Kamimura
Life of this patent
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Abstract
A control processor 1 stores a power supply current acquisition start address in a storage circuit 21 and a power supply current acquisition end address in a storage circuit 22. When a pattern generation address signal input from a pattern generator 2 matches the power supply current acquisition start address, a match detection circuit 23, 24 sets a flip-flop 6; when the pattern generation address signal matches the power supply current acquisition end address, the match detection circuit 23, 24 resets the flip-flop 6. An AND gate 7 outputs a clock signal to an AD converter 8 only while the flip-flop is set, and the AD converter 8 converts a current signal into a digital signal and outputs the digital signal to a storage circuit 9.
Claims8
An IC tester for conducting a frequency analysis of a power supply current fluctuating in response to a test pattern signal input to an IC and testing the IC, said IC tester comprising:
- a processor to generate address control signals and pattern data signals;
- circuitry to detect power supply current from the IC in response to the test pattern signal input to the IC;
- pattern address storage means for storing a start address and an end address based on the address control signals;
- power supply current storage means for storing only power supply current from the IC that is detected while a pattern specified by the start address and the end address is input to the IC;
- frequency analysis means for conducting a frequency analysis of the power supply current stored in said power supply current storage means;
- and
- said processor to determine whether or not the IC is good based on an analysis result of said frequency analysis means.
An IC test method for conducting a frequency analysis of a power supply current fluctuating in response to a test pattern signal input to an IC and testing the IC, said IC test method comprising the steps of:
- storing a start address and an end address of the test pattern signal input to the IC;
- storing only power supply current from the IC that is detected while the pattern specified by the start address and the end address is input to the IC;
- conducting a frequency analysis of the stored power supply current;
- and
- determining whether or not the IC is good based on an analysis result of said frequency analysis.
Dependencies are inferred from the claim text.