Method and system for compensating intensity fluctuations of an illumination system in a confocal microscope
AssigneeLeica Microsystems Heidelberg GmbH
InventorsJohann Engelhardt, Bernd Widzgowski
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AssigneeLeica Microsystems Heidelberg GmbH
InventorsJohann Engelhardt, Bernd Widzgowski
Estimating the term…
A method and system for compensating intensity fluctuations of an illumination system in a confocal microscope comprise a first and a second analog-to-digital converters for digitizing a first electrical signal corresponding to the light reflected from a specimen, and for digitizing a second electrical signal corresponding to an illumination reference, respectively. The digitized signals are sent to a first and a second look up tables carrying out a log conversion of the first and second electrical signals, respectively. Also provided is a calculator for correcting the first electrical signal for intensity fluctuations of the second electrical signal. The corrected electrical signal is sent to a third look up table for converting the corrected electric signal. The conversion is done by exponentiation of the corrected electrical signal.
A method for compensating intensity fluctuations of an illumination system in a confocal microscope having a scanning device and capable of generating a three-dimensional image of a specimen, the method comprising:
A system for compensating intensity fluctuations in a confocal microscope, the system comprising:
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