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US 6,443,784 B1Granted
Contact and contact assembly using the same
OwnerGunsei Kimotoinventor
Life of this patent
Estimating the term…
Abstract
The present invention provides a mechanism of a lattice type contact assembly capable of ensuring an appropriate space occupied by an deformation section, and a contact having an appropriate deformation structure conforming to the arrangement in which thin plate contacts are inclined. Contacts having winding elastic deformation sections such that the shape of elastic deformation sections can be selected from many possible alternatives and the relative positional relationship between input sections and output sections can be freely selected are arranged so as to have a certain angle with respect to the x-axis, thereby making it possible to realize a contact assembly with a lattice arrangement of a small pitch.
Claims8
A contact assembly comprising:
- a plurality of thin plate contacts, each thin plate contact including an input section adapted to be in contact with a terminal of an electronic device to be tested at one end thereof;
- an out put section adapted to be connected to a terminal of a testing circuit at the other end thereof;
- and
- an elastic deformation section located between the input section and the output section;
- wherein the plurality of terminals of the
- electronic device to be tested or the plurality of terminals of the testing circuit are arranged in a lattice shape in a planar x-y rectangular coordinate system,
- wherein the elastic deformation section of each of the plurality of contacts has a planar length which is longer than the length of a diagonal line of the lattice;
- wherein the elastic deformation section of each of the plurality of contacts is arranged so as to extend in a direction of a predetermined angle which is not the same as the angle of the diagonal line of the lattice with respect to an x-axis of an x-y- rectangular coordinate system;
- wherein the elastic deformation section of each of the plurality of contacts is arranged so as to extend beyond an area of the lattice to which the contact belongs to a next lattice by crossing the lattice pitch;
- and
- wherein, between the plurality of terminals of the electronic device to be tested or the plurality of terminals of the testing circuit forming a lattice, there are a plurality of elastic deformation sections comprising a plurality of contacts disposed in a manner that they extend in a crosswise direction in an angle which is not the same as the angle of the diagonal line of the lattice to which the contact belongs with respect to an x-axis of an x-y-rectangular coordinate system, and that they extend to a length longer than a diagonal line of the lattice, and they extend such that they do not interfere with one another.
8 more elements
A circuit testing device comprising:
- a contact assembly formed from a plurality of thin plate contacts, each of said contacts including an input section adapted to be in contact with a terminal of an electronic device to be tested at one end thereof and an output section adapted to be connected to a terminal of a testing circuit at the other end thereof, and an elastic deformation section located between the input section and the output section;
- and
- a testing circuit board connected to the output section;
- wherein the elastic deformation section of each of the plurality of contacts is arranged so as to extend in a direction of a predetermined angle which is not the same as the angle of the diagonal line of the lattice to which the contact belongs with respect to an x-axis of an x-y-rectangular coordinate system;
- wherein the elastic deformation section of each of the plurality of contacts is arranged so as to extend beyond an area of the lattice to which the contact belongs to a next lattice by crossing the lattice pitch;
- wherein a terminal of a circuit to be tested is contacted with the input section;
- and
- wherein between the plurality of terminals of the electronic device to be tested or the plurality of terminals of the testing circuit forming a lattice, there are a plurality of elastic deformation section of a plurality of contacts which are disposed in a manner such that they extend in a crosswise direction with the predetermined angle which is not the same as the angle of the diagonal line of the lattice to which the contact belongs with respect to an x-axis of an x-y rectangular coordinate system, that they extend to a length longer than the length of the diagonal line of a lattice, and that they extend so that they do not interfere with each other.
5 more elements
A connector, comprising:
- a contact assembly formed by arranging a plurality of thin plate contacts, each thin plate contact including an input section adapted to be in contact with a terminal of an electronic device to be tested at one end thereof, an output section adapted to be connected with a terminal of a testing circuit to the other end thereof, and an elastic deformation section located between the input section and the output section;
- wherein the elastic deformation section of each of the plurality of contacts has a planar length which is longer than the length of a diagonal line of a lattice;
- wherein the elastic deformation section of each of the plurality of contacts is arranged so as to extend in a direction of an angle which is not the same as the angle of the diagonal line of the lattice to which the contact belongs with respect to an x-axis of an x-y rectangular coordinate system;
- wherein the elastic deformation section of each of the plurality of contacts is arranged so as to extend beyond an area of the lattice to which the contact belong to a next lattice by crossing the lattice pitch;
- wherein a terminal of a circuit to be tested is contacted with the input section;
- wherein the plurality of terminals of the electronic device to be tested or the plurality of terminals of the testing circuit are arranged in a lattice shape in a planar x-y rectangular coordinate system;
- and
- wherein between the plurality of terminals of the electronic device to be tested or the plurality of terminals of the testing circuit forming a lattice, there are a plurality of elastic deformation section of a plurality of contacts which are disposed in a manner that they extend in a crosswise direction in an angle which is not the same as the angle of the diagonal line of the lattice to which the contact belongs with respect to an x-axis of an x-y rectangular coordinate system, that they extend to a length which is longer than the length of a diagonal line of a lattice, and that they extend under a condition such that they do not interfere with each other.
5 more elements
Dependencies are inferred from the claim text.