Multi-layered mirror
AssigneeNikon Corporation
InventorsKatsuhiko Murakami, Masayuki Shiraishi
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AssigneeNikon Corporation
InventorsKatsuhiko Murakami, Masayuki Shiraishi
Estimating the term…
A multi-layered mirror has a substrate, a first layer of a first substance, a second layer of a second substance. The refractive index of the first substance in a utilized wavelength region is different from that of the second substance. The first and second layers are laminated alternately on the substrate. To obtain a high reflectivity and superior optical characteristics, a multi-layered structure is formed within either the first layer or the second layer using at least two substances whose real parts of the complex indices of refraction in the utilized wavelength region are approximately the same. Alternatively, a layer surface is smoothed before forming a next layer thereon. An exposure apparatus that uses multi-layered mirrors of the present invention uses light with higher efficiency.
A multi-layered mirror comprising:
A multi-layered mirror comprising:
A multi-layered mirror comprising;
A method for manufacturing a multi-layered mirror upon a substrate comprising:
Dependencies are inferred from the claim text.
From the US filing history. Foreign family members aren’t listed.
Microphotolithographic exposure; Apparatus therefor: mask illumination systems
Nanotechnology for information processing, storage or transmission
Mask projection systems: optical aspects of catoptric systems, i.e. comprising only reflective elements, e.g. extreme ultraviolet [EUV] projection…
Using diffraction, refraction or reflection, e.g. monochromators: devices having a multilayer structure
Term ended 8 Sep 2019 (estimated)
1. Field of the Invention
The present invention relates to a multi-layered mirror, a manufacturing method thereof, a stress control method thereof, and an exposure apparatus. More particularly, the present invention relates to a multi-layered mirror for X-rays or neutrons, such as X-ray apparatus including X-ray telescopes, X-ray lasers, and soft X-ray projection lithography.
2. Description of the Related Art
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description, serve to explain the principles of the invention in the drawings:
FIGS. 1(a) and (b) are cross-sectional diagrams of one embodiment of a multi-layered mirror of the present invention;
FIGS. 2(a) and 2(b) and 2(c) are explanatory drawings of one example of a method of manufacturing a multi-layered mirror by irradiation using a particle beam P during multi-layered film formation stage;
Reference will now be made in detail to the preferred embodiments of the present invention, examples of which are illustrated in the accompanying drawings. Wherever possible, the same reference numbers will be used throughout the drawings to refer to the same or like parts.
It is known that substrate deformation becomes a problem due to internal stress of a multi-layered film when a Mo/Si multi-layered film is used as a mirror. It is also known that this internal stress can be lowered by increasing the number of layers while maintaining a fixed total film thickness of a multi-layered film and by decreasing the film thickness of each layer. (W. Wasa, S. Miwa, and K. Murakami, Internal Stress of a Mo/Si Multi-Layered Film, 56th Collection of Lecture Preprints of the Japan Society of Applied Physics, Vol.2, 1995). Using the method of increasing the number of layers by reducing thicknesses of various films, the periodic length (in case of a Mo/Si multi-layered film, the thickness of a pair of layers comprising an adjacent Mo and Si layers) of a multi-layered film decreases. Thus, this method can not be applied to a multi-layered mirror with a designated utilized wavelength.
In the present invention, internal stress is lowered without altering a periodic length of a multi-layered film. The following two methods are used to decrease internal stress of a multi-layered film: (1) a first method increases the number of interfaces of the multi-layered film by replacing an arbitrary layer (of a certain substance) of the multi-layered film with a multiple layer including the certain substance and a substance with the same δ optical constant as that of the certain substance; (2) a second method irradiates the layer surface with a particle beam as a multi-layered film is formed.