Apparatus and method for power continuity testing in a parallel testing system
AssigneeIntel Corporation
InventorJames E. Neeb
Life of this patent
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Abstract
Multiple devices can be tested simultaneously for power continuity or for other power performance characteristic(s). If any of the devices have short circuit defects, for example, the fuse devices connected between these defective devices and a single power supply restrict the amount of current drawn by the defective devices. This allows power continuity testing to continue for all of the other devices. At the same time, the reduced voltage level of the defective devices, caused by the restriction of current by their corresponding fuse device, can be detected by the voltage measurement device. The reduced voltage levels allow the defective devices to be identified by a test control apparatus and to be excluded from subsequent testing.
Claims20
An apparatus, comprising:
- a single power supply;
- a plurality of automatically resettable fuse devices coupled between the single power supply and input terminals of respective devices under test (DUTs), each of the resettable fuse devices being capable to reduce current flow from the single power supply to their respective DUT if that DUT is defective;
- and
- a measurement device coupled to the input terminals of each of the DUTs to detect an electrical characteristic associated with current flow into each of the DUTs and to provide the detected electrical characteristics to identify a defective DUT.
A system, comprising:
- an automated platform to support devices under test (DUTs);
- a single power supply;
- a plurality of automatically resettable fuse devices coupled between the single power supply and input terminals of respective DUTs, each of the resettable fuse devices being capable to reduce current flow from the single power supply to their respective DUT if that DUT is defective;
- and
- a measurement device coupled to the input terminals of each of the DUTs to detect an electrical characteristic associated with current flow into each of the DUTs and to provide the detected electrical characteristics to identify a defective DUT.
An apparatus, comprising:
- power supply;
- a plurality of automatically resettable fuse devices coupled between the power supply and respective devices under test (DUTs), each of the resettable fuse devices being capable to reduce current flow from the power supply to their respective DUT if that DUT is defective;
- and
- a measurement device coupled to the input terminals of each of the DUTs to detect an electrical characteristic associated with current flow into each of the DUTs and to provide information associated with the detected electrical characteristics to identify a defective DUT.
A system, comprising:
- a platform to support devices under test (DUTs);
- a power supply;
- a plurality of automatically resettable fuse devices coupled between the power supply and respective DUTs, each of the resettable fuse devices being capable to reduce current flow from the power supply to their respective DUT if that DUT is defective;
- and
- a measurement device coupled to the input terminals of each of the DUTs to detect an electrical characteristic associated with current flow into each of the DUTs and to provide the detected electrical characteristics to identify a defective DUT.
Dependencies are inferred from the claim text.