Method of manufacturing semiconductor device with sidewall metal layers
AssigneeNEC Corporation
InventorsNobuyuki Hayama, Masaaki Kuzuhara, Kouji Matsunaga, Tatsuo Nakayama, Yuji Takahashi, Yasuo Ohno, Kazuaki Kunihiro, Kensuke Kasahara, Hironobu Miyamoto, Yuji Ando
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