Back to results
US 6,440,753 B1Granted
Metal hard mask for ILD RIE processing of semiconductor memory devices to prevent oxidation of conductive lines
AssigneeInfineon Technologies North America Corp.
InventorsXian J. Ning, Joachim Nuetzel
Life of this patent
Estimating the term…
Abstract
A method of patterning conductive lines (252) of a memory array integrated circuit (200) using a hard mask (244) and reactive ion etching (RIE). Using a hard mask (244) prevents oxidation of underlying conductive lines (210).
Claims23
A method of manufacturing a semiconductor memory device, comprising:
- forming first conductive lines over a substrate;
- forming memory cells over the first conductive lines, the first conductive lines electrically coupled to the memory cells;
- depositing a dielectric layer over the memory cells;
- depositing a hard metal mask over the dielectric layer;
- and
- patterning at least the dielectric layer with the hard metal mask to form trenches within the dielectric layer.
3 more elements
A method of manufacturing a semiconductor memory device, comprising:
- depositing a first dielectric layer over a substrate;
- forming first conductive lines within the first dielectric layer;
- forming memory cells over the first conductive lines, the first conductive lines electrically coupled to the memory cells;
- depositing a second dielectric layer between the memory cells;
- depositing a third dielectric layer over the second dielectric layer and memory cells;
- depositing a hard metal mask over the third dielectric layer;
- depositing a resist over the hard metal mask;
- patterning the resist;
- patterning the hard metal mask with the resist;
- removing the resist;
- patterning at least the third dielectric layer with the hard metal mask to form trenches for second conductive lines;
- and
- depositing a conductive layer in the trenches over at least the memory cells to form second conductive lines, wherein the second conductive lines are electrically coupled to the memory cells.
10 more elements
Dependencies are inferred from the claim text.