Methods of testing sputtering target materials
AssigneeHoneywell International Inc.
InventorsRussell B. Gore, Ronald H. Fleming
Life of this patent
Estimating the term…
Loading patent…
AssigneeHoneywell International Inc.
InventorsRussell B. Gore, Ronald H. Fleming
Estimating the term…
The invention includes a method for testing materials, such as for example sputtering target materials, other materials for electronics applications, or other materials in general in which homogeneity throughout the material is desired. A plurality of positions are defined across at least a portion of a material. Sonic energy is sequentially irradiated across the plurality of positions. Echoes are induced by the sonic energy, and detected. At least some of the detected echoes are associated with individual positions of the plurality of positions that triggered the detected echoes. Information pertaining to at least one physical attribute of the detected echoes is processed to sort the detected echoes into a first group indicative of inhomogeneities in the material, and a second group which does not indicate inhomogeneities in the material. The echoes of the first group are sorted into clusters, with the clusters being defined as echoes from adjacent positions of the plurality of positions. The separate echoes associated with a common cluster are analyzed and considered together to generate information about an inhomogeneity in the material.
A method for testing substantially homogeneous materials for inhomogeneities, comprising:
A method for testing a plurality of sputtering targets, comprising:
A method for testing a material having a form and shape of a sputtering target, comprising:
A method for testing a material having a form and shape of a sputtering target, comprising:
Dependencies are inferred from the claim text.