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US 6,434,715 B1Granted
Method of detecting systemic fault conditions in an intelligent electronic device
AssigneeGeneral Electric Company
InventorBo L. Andersen
Life of this patent
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Abstract
A method of detecting systemic fault conditions in an intelligent electronic device is presented. The intelligent electronic device includes a microcontroller and associated memories. An algorithm (program) stored in a memory of the intelligent electronic device detects systemic fault conditions, i.e., root causes, as indicated by repeated, similar fault events.
Claims20
A method of detecting repeating events in an electrical distribution system at an intelligent electronic device of the electrical distribution system, comprising:
- generating an event signal indicative of a fault condition occurrence;
- comparing said event signal to a prior event signal indicative of a prior fault condition to determine if the fault condition is a repeat of the prior fault condition;
- and
- generating a repeat event signal when the fault condition is a repeat of the prior fault condition.
1 more element
An intelligent electronic device comprising:
- a sensor for sensing an electrical signal of an electrical distribution system to provide a sensed signal indicative of an electrical characteristic thereof;
- and
- a signal processor responsive to said sensed signal, and having memory for storing signal including program signals defining an executable program for,
- generating an event signal in response to said sensed signal, said event signal indicative of an event occurrence,
- comparing said event signal to a prior event signal indicative of a prior event to determine if the event is a repeat of the prior event, and
- generating a repeat event signal when the event is a repeat of the prior event.
3 more elements
Dependencies are inferred from the claim text.