Telecommunication apparatus test module with deflectable circuit switching contact

A telecommunications apparatus comprising an external plastics casing having a conductive path for a telecommunications signal, and a test contact within the casing having an electrically conductive member, the casing including a pair of wall members and an aperture therebetween providing access to the test contact member, thereby allowing a test probe to be attached to the test contact member and one wall member of the pair thereby deflecting the test contact member from a rest position towards a test position;

• the conductive path being a pair of conductors not in mutual contact but each in contact with a third conductive member when in its rest position, none of the three being in contact with the test contact member when the latter is in its rest position, deflection of the test contact member to a test position bringing said test contact member into contact with the third conductive member and causing said test contact member to be deflected from said rest position to said test position in which said test contact member is not in contact with at least one of the pair of conductors.

A telecommunications apparatus comprising an external plastics casing having a conductive path for a telecommunications signal, and a test contact within the casing having an electrically conductive member, the casing including a pair of wall members and an aperture therebetween providing access to the test contact member, thereby allowing a test probe to be attached to the test contact member and one wall member of the pair thereby deflecting the test contact member from a rest position towards a test position;

• the conductive path being a continuous path not in contact with the test contact member when the latter is in the rest position, which is broken when the test contact member is in the test position, one part of the path then being in contact with the test contact member.

A telecommunications apparatus comprising a conductive path segment from an exchange wire to a drop wire and a test port for accessing that conductive path, the conductive path segment including a first and a second contact disposed within the apparatus in a non-contacting manner, the test port including a generally elongate test contact member adjacent to a wall member, the test contact member being held in a first position by at least one biasing means but deflectable therefrom to a second position on application of a test probe to the test contact member and the wall member, wherein the first and second contacts are electrically connected by a further contact when the test contact member is in the first position and are not so connected when the test contact member is in the second position.

A telecommunications apparatus comprising a conductive path segment from an exchange wire to a drop wire and a test port for accessing that conductive path, the conductive path segment including a first and a second contact disposed within the apparatus such that electrical contact is made therebetween, the apparatus including a movable contact carrier situated adjacent the point of electrical contact,

• the test port including a generally elongate test contact member adjacent to a wall member, the test contact member being held in a first position by at least one biasing means but deflectable therefrom to a second position on application of an test probe to the test contact member and the wall member, deflection of the test contact member causing movement of the contact carrier such as to break the electrical contact between the first and second contacts.