Multi-step potentiostatic/galvanostatic plating control
AssigneeInternational Business Machines Corporation
InventorsDean S. Chung, Josef W. Korejwa, Erick G. Walton
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AssigneeInternational Business Machines Corporation
InventorsDean S. Chung, Josef W. Korejwa, Erick G. Walton
Estimating the term…
A method and apparatus are provided for the electroplating of a substrate such as a semiconductor wafer which provides a uniform electroplated surface and minimizes bum-through of a seed layer used on the substrate to initiate electroplating. The method and apparatus of the invention uses a specially defined multistep electroplating process wherein, in one aspect, a voltage below a predetermined threshold voltage is applied to the anode and cathode for a first time period followed by applying a current to the anode and cathode for a second time period the current producing a voltage below the predetermined threshold voltage. In another aspect of the invention, a current is applied to the anode and cathode substrate which current is preprogrammed to ramp up to a current value from a first current value which current produces a voltage below a predetermined threshold voltage. Electroplated articles including copper electroplated semiconductor wafers made using the apparatus and method of the invention are also provided.
A multistep electroplating process for electroplating a substrate containing a seed layer thereon with copper or other metal comprising the steps of:
A multistep electroplating process for electroplating a substrate containing a seed layer thereon with copper or other metal comprising the steps of:
An apparatus for electroplating a substrate containing a seed layer thereon with copper or other metal which is immersed in an electroplating bath comprises:
An apparatus for electroplating a substrate containing a seed layer thereon with copper or other metal comprises:
Dependencies are inferred from the claim text.