Deep sub-micron static timing analysis in the presence of crosstalk
AssigneeSynopsys, Inc.
InventorsPeivand Fallah-Tehrani, Shang-Woo Chyou
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AssigneeSynopsys, Inc.
InventorsPeivand Fallah-Tehrani, Shang-Woo Chyou
Estimating the term…
A method for static timing analysis of deep sub-micron devices in presence of crosstalk. The present invention provides an efficient platform for fast and accurate static timing verification of large scale transistor and cell level netlists, with coupled interconnects and high switching speeds. The present invention also provides a novel approach to solve the coupled noise problem in static timing verification. The present invention also provides for a method of determining worst case aggressor switching time for a cross-coupled interconnect stage. After the worst case aggressor switching time is determined, the netlist is then resimulated using the worst case aggressor switching time to determine more accuate stage delay and slew of the interconnect stage. The output waveform is recorded and utilized as the input of subsequent stages.
In a computer system, a method of analysing crosstalk effects on interconnects of an integrated circuit design represented as a netlist, the method comprising the steps of:
A computer-readable medium having contained therein computer-readable codes for causing a computer-implemented electronics design automatic (EDA) to perform a method of analysing crosstalk effects on interconnects of an integrated circuit design represented as a netlist, the method comprising the steps of:
A computer-implemented electronics design automation (EDA) system comprising:
In a computer system, a method of analysing crosstalk effects on interconnects of an integrated circuit design represented as a netlist, the method comprising the steps of:
Dependencies are inferred from the claim text.