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AssigneeKoninklijke Philips Electronics N.V.
InventorsGaston M. I. Porteners, Robert H. De Nie, Johannes Th. Van Der Heiden, Roland P. Jansen, Petrus A. L. De Jong, Petrus A. J. M. Palm, Vincent Pronk
Estimating the term…
The invention relates to an integrated circuit with at least an analog and a digital circuit that are interconnected by a signal path. In order to enable separate testing of the circuits, for example in accordance with the macro test approach, in the signal path a special seam circuit (200) is inserted. The seam circuit (200) is essentially a feedback loop (214) having a scannable flip-flop (210) and a multiplexer (220). The flip-flop (210) feeds a first input of the multiplexer (220), whereas a second input of the multiplexer (220) establishes an input (230) of the seam circuit (200). An output of the feedback loop (214) establishes an output of the seam circuit (200). The state of the multiplexer (220) defines the state of the seam circuit (200), in a first state of the multiplexer (220) the seam circuit (200) being transparent for signals being transferred along the signal path from one circuit to another, and in a second state of the multiplexer (220) the seam circuit (200) outputting a signal that was loaded in the feedback loop (214) beforehand.
Integrated circuit comprising at least one analog circuit, at least one digital circuit and at least one signal path providing an observable and controllable node on the at least one signal path between the analog circuit and the digital circuit such that a broad range of analog and digital test opportunities are provided,
An integrated circuit comprising:
Dependencies are inferred from the claim text.