Shock resistant breaker shunt trip

Abstract

A shunt trip assembly having a tripping solenoid and a locking solenoid selectively blocks movement of the tripping solenoid to prevent inappropriate tripping of a circuit breaker during shock loading thereof. The tripping solenoid includes a tripping plunger that is longitudinally translatable along a tripping path to operatively engage a trip button of the circuit breaker. The locking solenoid includes a locking plunger that is selectively translatable along a locking path to selectively block movement of the tripping plunger, the locking path being substantially perpendicular to the tripping path. A longitudinally-facing first abutment surface on the tripping plunger is engaged by the locking plunger to prevent inappropriate movement of the tripping plunger during shock loading. A peripherally-disposed second abutment surface on the tripping plunger prevents misconfiguration of the shunt trip assembly after the shunt trip assembly has been deenergized. The tripping solenoid and locking solenoid are simultaneously energized and deenergized.

Dependencies are inferred from the claim text.