Low temperature oxidation of conductive layers for semiconductor fabrication
AssigneeInfineon Technologies AG
InventorsOliver Genz, Alexander Michaelis
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Abstract
A method for forming a valve metal oxide for semiconductor fabrication in accordance with the present invention is disclosed and claimed. The method includes the steps of providing a semiconductor wafer, depositing a valve metal on the wafer, placing the wafer in an electrochemical cell such that a solution including electrolytes interacts with the valve metal to form a metal oxide when a potential difference is provided between the valve metal and the solution and processing the wafer using the metal oxide layer.
Claims28
A method for forming a valve metal oxide for semiconductor fabrication comprising the steps of:
- providing a semiconductor wafer;
- depositing a valve metal material on the wafer;
- patterning the valve metal;
- after patterning the valve metal, placing the wafer in an electrochemical cell such that a solution including electrolytes interacts with the valve metal material to form a metal oxide when a potential difference is provided between the valve metal material and the solution;
- and
- processing the wafer using the metal oxide layer as an etch mask for patterning structures underlying the valve metal.
A method for etching trenches in a semiconductor substrate comprising the steps of:
- providing a semiconductor substrate;
- forming a pad stack of the substrate;
- depositing a valve metal material on the pad stack;
- patterning the valve metal material;
- placing the substrate in an electrochemical cell such that a solution including electrolytes interacts with the patterned valve metal material to form a metal oxide when a potential difference is provided between the patterned valve metal material and the solution;
- and
- employing the metal oxide as an etch mask for etching trenches into the substrate.
A method for forming a valve metal oxide for semiconductor fabrication comprising the steps of:
- providing a semiconductor wafer including a substrate having at least one layer formed thereon;
- depositing a dielectric layer on the at least one layer;
- depositing a valve metal material on the dielectric layer;
- patterning the valve metal material;
- oxidizing the patterned valve metal material by placing the wafer in an electrochemical cell such that a solution including electrolytes interacts with the patterned valve metal material to form a metal oxide when a potential difference is provided between the patterned valve metal material and the solution, the dielectric layer for providing protection for the at least one layer during the oxidizing step;
- and
- patterning structures underlying the patterned valve metal using the metal oxide layer as an etch mask.
Dependencies are inferred from the claim text.