Methods for preparing an epitaxial wafer having a gallium nitride epitaxial layer deposited on a semiconductor substrate
AssigneeSumitomo Electric Industries, Ltd.
InventorsKensaku Motoki, Masato Matsushima, Katsushi Akita, Mitsuru Shimazu, Kikurou Takemoto, Hisashi Seki, Akinori Koukitu
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Abstract
The present invention provides an epitaxial wafer comprising a (111) substrate of a semiconductor having cubic crystal structure, a first GaN layer having a thickness of 60 nanometers or more, a second GaN layer having a thickness of 0.1 μm or more and a method for preparing it.
Claims11
A method for preparing an epitaxial layer onto GaAs substrate comprising the steps of:
- supplying a first mixture of material gases comprising a metallorganic including Ga and HCl and a second mixture of material gases comprising NH3 into a chamber heated by a heat source disposed outside of said chamber;
- growing a buffer layer having a thickness in the range of 60 nanometers to 200 nanometers by vapor deposition on a GaAs substrate at a first temperature of 400-600° C. disposed in the chamber;
- improving crystallinity of the buffer layer by increasing substrate temperature from the first temperature;
- and
- supplying said first and second mixture of material gases into said chamber in which the substrate is heated at a second temperature higher than said first temperature to grow a GaN layer on said buffer layer.
A method for preparing an epitaxial layer onto GaAs substrate comprising the steps of:
- supplying a first mixture of material gases comprising HCl and a second mixture of material gases comprising NH3 into a chamber heated by a heat source disposed outside of said chamber;
- forming GaCl by reacting metal Ga contained in a vessel in said chamber with HCl included in said first mixture of material gases;
- growing a buffer having a thickness in the range of 60 nanometers to 200 nanometers by vapor deposition on a GaAs substrate at a first temperature of 400-600° C. disposed in the chamber;
- improving crystallinity of the buffer layer by increasing substrate temperature from the first temperature;
- and
- supplying said first and second mixtures of material gases into said chamber in which the substrate is heated at a second temperature higher than said first temperature to grow a GaN layer on said buffer layer.
A method for preparing an epitaxial wafer comprising the steps of:
- supplying a first mixture of material gases comprising a metallorganic including Ga and HCl and a second mixture of material gases comprising NH3 into a chamber heated by a heat source disposed outside of said chamber;
- growing a buffer layer having a thickness in the range of 60 nanometers to 200 nanometers by vapor deposition on a GaAs substrate at a first temperature of 400-600° C. disposed in the chamber;
- improving crystallinity of the buffer layer by increasing substrate temperature from the first temperature;
- and
- supplying said first and second mixture of material gases into said chamber in which the substrate is heated at a second temperature higher than said first temperature to grow a GaN layer on said buffer layer.
A method for preparing an epitaxial wafer comprising the steps of:
- supplying a first mixture of material gases comprising HCl and a second mixture of material gases comprising NH3 into a chamber heated by a heat source disposed outside of said chamber;
- forming GaCl by reacting metal Ga contained in a vessel in said chamber with HCl included in said first mixture of material gases;
- growing a buffer having a thickness in the range of 60 nanometers to 200 nanometers by vapor deposition on a GaAs substrate at a first temperature of 400-600° C. disposed in the chamber,
- improving crystallinity of the buffer layer by increasing substrate temperature from the first temperature;
- and
- supplying said first and second mixtures of material gases into said chamber in which the substrate is heated at a second temperature higher than said first temperature to grow a GaN layer on said buffer layer.
A method for preparing an epitaxial layer onto GaAs substance comprising the steps of:
- supplying a first mixture of material gases comprising a metallorganic including Ga and HCl and a second mixture of material gases comprising NH3 into a chamber heated by a heat source disposed outside of said chamber;
- growing a first GaN layer having a thickness in the range of 60 nanometers to 200 nanometers by vapor deposition on a GaAs substrate at a first temperature of 400-600° C. disposed in the chamber;
- growing a second GaN layer having a thickness in the range of 0.1 micrometers or more having improved crystallinity of the buffer layer due to increasing substrate temperature from the first temperature, and
- supplying said first and second mixture of material gases into said chamber in which the substrate is heated at a second temperature higher than said first temperature to grow said first and second GaN layers on said buffer layer.
Dependencies are inferred from the claim text.