Single tip Kelvin probe
AssigneeFluke Corporation
InventorsEdward J. Hager, Rondal K. Harmon, Jr.
Life of this patent
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AssigneeFluke Corporation
InventorsEdward J. Hager, Rondal K. Harmon, Jr.
Estimating the term…
A Kelvin probe system is described for measuring resistance between two locations on an electrical device, by the use of two probe assemblies that each includes two wires, wherein each probe assembly is of simplified construction, easier to use, and more reliable. Each probe assembly (110, 112) includes a single point probe tip (12) with a pointed proximal end (102) for engaging a device contact and with a distal end (106). A cable (110) with voltage and current conductors (114, 116) has distal ends (120, 122) connected to contacts of a connector, and proximal ends (130, 132) each connected to the distal end of the probe tip. Although a large current passes through the current conductor (116) and through the length of the probe tip, the resistance-caused voltage drop across the probe tip is very small and therefore does not significantly affect accuracy of a resistance measurement.
Kelvin probe apparatus comprising:
A Kelvin probe system for measuring resistance or impedance between a pair of location on an electrical device which includes a Kelvin resistance measuring circuit device that includes first voltage and current circuit terminals and second voltage and current circuit terminals, and a resistance-measuring subcircuit connected to said circuit terminals, said circuit device including a source that flows a current between said first and second current terminals and through the electrical device, comprising:
A Kelvin probe for use with another similar probe device and a Kelvin resistance impedance measuring circuit to measure resistance or impedance comprising:
A Kelvin probe comprising:
A Kelvin probe comprising:
Dependencies are inferred from the claim text.