Silicone polymer insulation film on semiconductor substrate and method for forming the film
AssigneeASM Japan K.K.
InventorsNobuo Matsuki, Yuichi Naito, Yoshinori Morisada, Aya Matsunoshita
Life of this patent
Estimating the term…
Loading patent…
AssigneeASM Japan K.K.
InventorsNobuo Matsuki, Yuichi Naito, Yoshinori Morisada, Aya Matsunoshita
Estimating the term…
A method for forming a silicone polymer insulation film having a low dielectric constant, high thermal stability, high humidity-resistance, and high O2 plasma resistance on a semiconductor substrate is applied to a plasma CVD apparatus. The first step is introducing a silicon-containing hydrocarbon compound expressed by the general formula SiαOα−1(R)2α−β+2(OCnH2n+1)β (α, β, x, and y are integers) and then introducing the vaporized compound to the reaction chamber of the plasma CVD apparatus. The residence time of the material gas is lengthened by, for example, reducing the total flow of the reaction gas, in such a way as to form a silicone polymer film having a micropore porous structure with a low dielectric constant.
A method for forming a silicone polymer insulation film on a semiconductor substrate by plasma treatment, comprising the steps of:
Dependencies are inferred from the claim text.