Ultrasonic defect detection system
AssigneeMassachusetts Institute of Technology
InventorsShi-Chang Wooh, Ji-Yong Wang
Life of this patent
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Abstract
An ultrasonic defect detection system includes a steered beam transmitter for directing an ultrasonic beam through the front face to the back face of a specimen; a sensor device for sensing the location on the front face of the near shadow of a defect from the beam reflected from the back face before the defect and the far shadow of the defect from the beam reflected from the back face after the defect; and an arithmetic circuit responsive to the location of the shadows on the front face for determining the distance between the transmitter and the near and far boundary of the near shadow and at least the near boundary of the far shadow for calculating the location and/or the size and/or the orientation of the defect.
Claims19
An ultrasonic defect detection system comprising:
- a steered beam transmitter for directing an ultrasonic beam through the front face to the back face of a specimen;
- a sensor device for sensing the location on the front face of the near shadow of a defect from the beam reflected from the back face of the specimen before the defect and the far shadow of the defect from the beam reflected from the back face after the defect;
- and
- an arithmetic circuit responsive to the location of the shadows on the front face for determining the distance between the transmitter and the near and far boundary of the near shadow and at least the near boundary of the far shadow for calculating the location of the defect.
An ultrasonic defect detection system comprising:
- a steered beam transmitter for directing an ultrasonic beam through the front face to the back face of a specimen;
- a sensor device for sensing the location on the front face of the near shadow of a defect from the beam reflected from the back face of the specimen before the defect and the far shadow of the defect from the beam reflected from the back face after the defect;
- and
- an arithmetic circuit responsive to the location of the shadows on the front face for determining the distance between the transmitter and the near and far boundary of the near shadow and at least the near boundary of the far shadow for calculating the size of the defect.
An ultrasonic defect detection system comprising:
- a steered beam transmitter for directing an ultrasonic beam through the front face to the back face of a specimen;
- a sensor device for sensing the location on the front face of the near shadow of a defect from the beam reflected from the back face of the specimen before the defect and the far shadow of the defect from the beam reflected from the back face after the defect;
- and
- an arithmetic circuit responsive to the location of the shadows on the front face for determining the distance between the transmitter and the near and far boundary of the near shadow and at least the near boundary of the far shadow for calculating the orientation of the defect.
An ultrasonic defect detection system comprising:
- a steered beam transmitter for directing an ultrasonic beam through the front face to the back face of a specimen;
- a sensor device for sensing the location on the front face of the near shadow of a defect from the beam reflected from the back face of the specimen before the defect and the far shadow of the defect from the beam reflected from the back face after the defect;
- and
- an arithmetic circuit responsive to the location of the shadows on the front face for determining the distance between the transmitter and the near and far boundary of the near shadow and at least the near boundary of the far shadow for calculating the location, size and orientation of the defect.
Dependencies are inferred from the claim text.