Method of testing light emission condition of exposing head and dot pattern for use in the method
AssigneeNoritsu Koki Co., Ltd.
InventorYoshiyuki Nakatani
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AssigneeNoritsu Koki Co., Ltd.
InventorYoshiyuki Nakatani
Estimating the term…
A method is disclosed for testing a light emission condition of an exposing head of a type including a plurality of luminous elements arranged along a main scanning direction for forming a linear dot pattern on a print paper. The exposing head is movable relative to the print paper in a sub scanning direction. The emission amounts of the respective luminous elements are compared to each other, based on the densities of respective dots obtained by exposure on the print paper. For allowing more accurate grasping of the light emission of each luminous element, testing target dots are formed by driving luminous elements selected as target elements which are not adjacent each other in the main scanning direction. Further, background dots are formed in the peripheries of the target dots so that the peripheries are completely filled with the background dots having a density higher than that of the target dots.
A method of testing a light emission condition of an exposing head of a type including a plurality of luminous element arranged along a main scanning direction for forming a linear dot pattern on a print paper, the exposing head being movable relative to the print paper in a sub scanning direction, the method comparing emission amounts of the respective luminous elements relative to each other based on the absolute densities of respective dots obtained by exposure on the print paper, the method comprising the steps of:
A testing dot pattern for testing a light emission condition of an exposing head of a type including a plurality of luminous elements arranged along a main scanning direction for forming a linear dot pattern on a print paper, the exposing head being movable relative to the print paper in a sub scanning direction, the dot pattern being obtained by exposing on the print paper by the exposing head for comparing emission amounts of the respective luminous elements relative to each other, the testing dot pattern comprising:
A testing dot pattern for testing a light emission condition of an exposing head of a type including a plurality of luminous elements arranged along a main scanning direction for forming a linear dot pattern on a print paper, the exposing head being movable relative to the print paper in a sub scanning direction, the dot pattern being obtained by exposing on the print paper by the exposing head for comparing emission amounts of the respective luminous elements relative to each other, the relative emission amounts of the luminous elements being obtained by determining the densities of the respective images of the target dots by using a scanner, the testing dot pattern comprising;
Dependencies are inferred from the claim text.