3D profile analysis for surface contour inspection
AssigneeAsti Corporation
InventorsSreenivas Rao, Noor Ashedah Binti Jusoh, Wong Soon Wei, Tan Seow Hoon, Satish Kaveti
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Abstract
A system for inspecting a component is provided. The system includes an imaging system, such as a digital camera. A controller is connected to the digital camera. The controller receives the digital image data of a device that is generated by the camera. The controller processes the digital image data to generate control commands. A variable grid generation system is also connected to the controller. The variable grid generation system can receive commands from the controller, and can generate a grid in response to the commands that matches the component and that allows the component to be inspected.
Claims8
A system for inspecting a component comprising:
- an imaging system operable to generate digital image data of the component;
- a controller coupled to the imaging system, the controller operable to receive the digital image data and to process the digital image data to generate control commands;
- and
- a variable grid generation system coupled to the controller, the variable grid generation system operable to receive the control commands and to generate a grid in response to the control commands;
- the variable grid generation system further comprising:
- a first and second laser, each generating a laser beam having a frequency and wavelength that is different from the light of the other laser;
- a first mirror system receiving the first laser beam and moving the laser beam in an “X” axis;
- a second mirror system receiving the laser beam and moving the laser beam in a “Y” axis;
- and
- wherein the first mirror system and the second mirror system are controlled by the controller in a coordinated manner so as to generate the grid.
Dependencies are inferred from the claim text.