Enhancing voltmeter functionality

A method for dynamic testing of a circuit under load, the method comprising:

• removing a component from the circuit under load;
• coupling leads of a digital voltmeter to remaining terminals of the removed component in the circuit;
• closing a switch to short circuit inputs of the digital voltmeter through a test load;
• and
• making dynamic tests of the circuit under load using the digital voltmeter, the test load completing the circuit under load.

An enhanced functionality digital voltmeter comprising:

• circuitry for dynamic testing of a circuit under load, comprising:
• a test load adapted to be coupled between inputs of a digital voltmeter, the test load replacing a component of the circuit under load;
• and
• a switch adapted to short circuit test leads of the digital voltmeter through the test load.

A method of enhancing digital voltmeter functionality, the method comprising:

• incorporating, in a digital voltmeter, circuitry for dynamic testing of a circuit under load, comprising:
• incorporating a test load adapted to be coupled between inputs of the digital voltmeter for replacing a component of the circuit under load;
• and
• incorporating a switch adapted to short circuit test leads of the digital voltmeter through the test load.

Test leads for testing a circuit under test with a digital voltmeter, comprising:

• a first test lead;
• a second test lead;
• and
• a load adapted to be switchably coupled between the first and second test leads such that, in one switchable state, the load completes the circuit under test, replacing a component of the circuit under test.