Mesoscopic non-magnetic semiconductor magnetoresistive sensors fabricated with island lithography
AssigneesImperial College of Science, Technology and Medicine, NEC Research Institute, Inc., Mitsubishi Materials Corporation
InventorsMino Green, Koichi Sassa, Stuart A. Solin, Richard A. Stradling, Shin Tsuchiya
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Abstract
Mesoscopic magnetic field sensors which can detect weak magnetic fields (typically 0.05 Tesla) over areas as small as tens of thousands of square nanometers (e.g. 40 nm×400 nm). The combination of enhanced magneto-resistance in an inhomogeneous high mobility semiconductor, having special electrode arrangements, with the use of island lithography, enables the production of special semiconductor/metal nano-composite structures, and has made possible the fabrication of an entirely new type of magnetic field sensor which exhibits very superior magneto-resistive behavior.
Claims46
A method of measuring weak magnetic fields comprising:
- utilizing island lithography to fabricate a mesoscopic magnetic sensor in an inhomogeneous high mobility semiconductor with metal inclusions in a nano-composite structure having enhanced magnetoresistance;
- and
- measuring the magnetoresistance in the fabricated inhomogeneous high mobility semiconductor nano-composite structure.
A mesoscopic magnetoresistive sensor fabricated with island lithography for measuring weak magnetic fields comprising:
- a mesoscopic magnetic sensor fabricated utilizing island lithography to form an inhomogeneous high mobility semiconductor with metal inclusions in a nano-composite structure having enhanced magnetoresistance;
- means for measuring the magnetoresistance in the fabricated inhomogeneous high mobility semiconductor nano-composite structure.
Dependencies are inferred from the claim text.