Silicone polymer insulation film on semiconductor substrate and method for forming the film
AssigneeASM Japan K.K.
InventorsNobuo Matsuki, Yuichi Naito, Yoshinori Morisada, Aya Matsunoshita
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AssigneeASM Japan K.K.
InventorsNobuo Matsuki, Yuichi Naito, Yoshinori Morisada, Aya Matsunoshita
Estimating the term…
A method for forming a silicone polymer insulation film having a low relative dielectric constant, high thermal stability and high humidity-resistance on a semiconductor substrate is applied to a plasma CVD apparatus. The first step is introducing a silicon-containing hydrocarbon compound expressed by the general formula SiαOβCxHy (α, β, x, and y are integers) to the reaction chamber of the plasma CVD apparatus. The silicon-containing hydrocarbon compound has at most two O—CnH2n+1 bonds and at least two hydrocarbon radicals bonded to the silicon. The residence time of the material gas is lengthened by, for example, reducing the total flow of the reaction gas, in such a way as to form a silicone polymer film having a micropore porous structure with a low relative dielectric constant.
A method for forming a silicone polymer insulation film on a semiconductor substrate by plasma treatment, comprising the steps of:
Dependencies are inferred from the claim text.