Magnetic random access memory circuit

Abstract

In a magnetic random access memory circuit, the potential of all sense lines 121 to 124 are equalized, and the potential of all not-selected word lines 133, 135, 136 are equalized and the selected word line 134 is grounded so that a previously charged capacitor 114 is discharged by a current path passing from the capacitor 114 through a MOS transistor 118 maintaining the potential of the sense line 122 at a constant voltage lower than a break voltage, through the selected sense line 122, through the selected magneto-resistive element 142 and through the selected word line 134. Thus, a voltage applied to the magneto-resistive element is maintained at a level smaller than a voltage breaking the magneto-resistive elements or a voltage remarkably deteriorating the characteristics of the magneto-resistive elements because of a biasing effect when the tunnel magneto-resistive element is used, and on the other hand, a high precise and high speed reading can be realized.

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