System and method for trimming IC parameters

Abstract

A circuit and method for trimming and simulating the effect of trimming a plurality of IC parameters. Trim signals which affect respective IC parameters are generated with respective digital-to-analog converters (DACs) in response to digital bit patterns. A parameter to be trimmed is selected, a bit pattern is applied to a DAC and a trim signal generated, and the value of the parameter that results is measured. Bit patterns are iteratively created until one is identified that brings the parameter within an acceptable range. The identified bit pattern is then permanently encoded using programmable subcircuits containing poly fuses. The bit patterns are received serially to conserve I/O pins. A number of DACs are provided to enable a number of different parameters to be simulated and trimmed. A switching network is provided that selectably switches otherwise inaccessible internal nodes to an I/O pin for measurement. The trimming circuitry. is packaged within the IC package and is operable via its I/O pins, enabling the IC's parameters to be trimmed post-assembly.

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