Multiple edge-emitting laser components located on a single wafer and the on-wafer testing of the same

Abstract

An edge-emitting laser having an edge-emitting output and a surface-emitting output. The edge-emitting laser has a resonator having a high order grating, preferably a second order grating capable of producing an edge-emitting component and a surface-emitting component. A waveguide is also located in the resonator and a cap layer is located above the waveguide and grating. The cavity is tested by taking measurements from the surface-emitting component eliminating the need for taking measurements from the edge-emitting component which is time consuming and expensive.

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