Semiconductor device having on-chip terminal with voltage to be measured in test

Abstract

A step-down circuit 10A comprises a voltage follower circuit 20A for receiving a voltage VG, to be measured, of an internal circuit, activated in response to activation of a test mode signal TM, and providing its output to an on-chip pad 16A. Although a large current flows through an output buffer circuit 22 of the voltage follower circuit 20A compared with that of an output buffer circuit 15 of a voltage control circuit 12, this large current does not flow when the signal TM is inactive. The voltage follower circuit having a comparatively large area on chip can commonly be used with a selection circuit for selecting one of nodes with voltages to be measured. In a case of SDRAM, the signal TM may be an output of the command decoder and a selection control signal may be an address signal.

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