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US 6,333,879 B1Granted
Semiconductor device operable in a plurality of test operation modes
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsTetsuo Kato, Kei Hamade
Life of this patent
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Abstract
A circuit generating a test mode instructing signal includes a test mode register circuit which is set to a state disabling instruction of a test mode in a standby state. An intended test mode can be accurately selected even when the test mode is instructed in accordance with a plurality of external signals varied in timing from each other. A semiconductor device allows accurate and efficient execution of the test without requiring increase in area occupied by an array.
Claims13
A semiconductor device comprising:
- tuning signal generating circuitry activated in response to a tuning mode instructing signal to transmit a tuning signal for tuning a voltage between predetermined circuit nodes onto a tuning signal line;
- and
- test mode activating circuitry responsive to a test mode instructing signal for generating onto said tuning signal line a signal for activating a test mode designated by said test mode instructing signal.
A semiconductor device comprising:
- a memory array including a plurality of memory cells arranged in rows and columns;
- a plurality of bit line pairs provided correspondingly to the columns of said memory cells, each of the bit line pairs connected to the memory cells in a corresponding column;
- a plurality of sense amplifiers provided corresponding to said bit line pairs, each of the sense amplifiers activated in accordance with a voltage on a sense drive node to perform differential amplification of potentials on a corresponding bit line pair;
- a sense power supply for generating a power supply voltage for the sense amplifiers;
- circuitry for internally generating an internal voltage at a level different from said power supply voltage;
- and
- transmission circuitry activated in response to activation of a test mode instructing signal to transmit said internal voltage to said sense drive node.
4 more elements
Dependencies are inferred from the claim text.