Apparatus for measuring a profile of an electron beam of a CRT
AssigneeMinolta Co., Ltd.
InventorYoshihiro Nishikawa
Life of this patent
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Abstract
An apparatus for measuring a profile of an electron beam of a CRT includes a test pattern generator which generates a test pattern having a plurality of separate luminous images on a fluorescent surface of the CRT, and an image pickup device which picks up the plurality of separate luminous images in a single pickup operation. Positions of phosphors defining one luminous image are made to be relatively different from those of phosphors defining another luminous image. The apparatus is provided with a relative position calculator for calculating respective relative positions of phosphors defining each luminous image, and a beam profile calculator for calculating a profile of an electron beam of the CRT based on outputted pixel data and calculated relative positions.
Claims40
An apparatus for measuring a profile of an electron beam of a CRT, the apparatus comprising:
- a test pattern signal generator which generates a signal which controls an electron gun device of a CRT to produce a test pattern having a plurality of separate luminous images on a fluorescent surface of the CRT, positions of phosphors defining one luminous image being relatively different from those of phosphors defining another luminous image;
- an image pickup device which picks up the plurality of separate luminous images in a single pickup operation to output pixel data in accordance with a luminance of phosphors defining each luminous image;
- a relative position calculator which calculates respective relative positions of phosphors defining each luminous image;
- and
- a beam profile calculator which calculates a profile of an electron beam of the CRT based on outputted pixel data and calculated relative positions.
An apparatus for evaluating a performance of a CRT, the apparatus comprising:
- a test pattern signal generator which generates a signal which controls an electron gun device of a CRT to produce a test pattern having a plurality of separate luminous images on a fluorescent surface of the CRT, positions of phosphors defining one luminous image being relatively different from those of phosphors defining another luminous image;
- an image pickup device which picks up the plurality of separate luminous images in a single pickup operation to output pixel data in accordance with a luminance of phosphors defining each luminous image;
- a relative position calculator which calculates respective relative positions of phosphors defining each luminous image;
- and
- a calculator which calculates an energy density distribution of an electron beam of the CRT based on outputted pixel data and calculated relative positions.
A method for measuring a profile of an electron beam of a CRT, the method comprising the steps:
- producing a test pattern having a plurality of separate luminous images on a fluorescent surface of a CRT, positions of phosphors defining one luminous image being relatively different from those of phosphors defining another luminous image;
- picking up the plurality of separate luminous images in a single pickup operation to generate pixel data in accordance with a luminance of phosphors defining each luminous image;
- calculating respective relative positions of phosphors defining each luminous image;
- and
- calculating a profile of an electron beam of the CRT based on generated pixel data and calculated relative positions.
A method for evaluating a performance of a CRT, the method comprising the steps of:
- producing a test pattern having a plurality of separate luminous images on a fluorescent surface of the CRT, positions of phosphors defining one luminous image being relatively different from those of phosphors defining another luminous image;
- picking up the plurality of separate luminous images in a single pickup operation to generate pixel data in accordance with a luminance of phosphors defining each luminous image;
- calculating respective relative positions of phosphors defining each luminous image;
- and
- calculating an energy density distribution of an electron beam of the CRT based on generated pixel data and calculated relative positions.
Dependencies are inferred from the claim text.