Semiconductor device and apparatus and method for manufacturing the same
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsJunko Izumitani, Kazuyoshi Maekawa
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AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsJunko Izumitani, Kazuyoshi Maekawa
Estimating the term…
Disclosed is an apparatus for manufacturing a semiconductor device including a metal film which is formed on a semiconductor substrate in a film formation region containing the interior of a hole formed in the semiconductor substrate. The apparatus includes a degassing chamber, a film forming chamber, and a cooing chamber. The degassing chamber 34 is provided for carrying out a degassing process by heating the semiconductor substrate to a degassing temperature. The film forming chamber 40 is provided for forming a metal film on the film formation region in a state in which the semiconductor substrate is heated to a film formation temperature. The cooling chamber 38 is provided for cooling, after completion of the degassing process and before beginning of the formation of the metal film, the semiconductor substrate to a cold temperature being lower than the film formation temperature and in a range of −50° C. to 150° C.
A method for manufacturing a semiconductor device including a metal film formed in a film formation region which contains the interior of a hole formed in the semiconductor substrate, said method comprising the steps of:
A method for manufacturing a semiconductor device including a metal film formed in a film formation region which contains the interior of a hole formed in the semiconductor substrate, said method comprising the steps of:
Dependencies are inferred from the claim text.