Application specific automated test equipment system for testing integrated circuit devices in a native environment

A system comprising:

• an automated test equipment unit;
• and
• an interface board coupled to the automated test equipment unit, the interface board comprising:
• a test device interface,
• one or more native devices coupled to the test device interface, the one or more native devices selected and configured to recreate a native electrical and functional environment of a test device coupled to the test device interface,
• a first clock circuit generating a first clock signal transmitted to the one or more native interface devices, and
• a second clock circuit comprising a timing control circuit generating a second clock signal transmitted to the test device coupled to the test device interface, wherein the second clock signal is derived from the first clock signal, and wherein the timing control circuit includes an amplifier circuit operable to shift an amplitude characteristic of the second clock signal relative to a corresponding amplitude characteristic of the first clock signal.

An apparatus for testing an integrated circuit device comprising:

• means for interfacing the integrated circuit device to an automated test equipment system, wherein the interface means includes one or more native devices selected and configured recreate a native operating environment of the integrated circuit device;
• means for propagating a first clock signal to the one or more native devices;
• means for deriving a second clock signal from the first clock signal and propagating the second clock signal to the integrated circuit device;
• means for writing input data to the integrated circuit device;
• means for reading output data from the integrated circuit device;
• means for determining whether the output data matches the input data in accordance with predetermined criteria;
• and
• means for changing a timing characteristic and an amplitude characteristic of the second clock signal relative to respective and corresponding timing and amplitude characteristics of the first clock signal until the output data fails to meet the predetermined criteria with respect to the input data.

A method of testing an integrated circuit device comprising the steps of:

• providing an interface board to couple the integrated circuit device to an automated test equipment system, wherein the interface board includes one or more native devices selected and configured recreate a native operating environment of the integrated circuit device;
• propagating a first clock signal to the one or more native devices on the interface board;
• propagating a second clock signal to the integrated circuit device;
• writing input data to the integrated circuit device;
• reading output data from the integrated circuit device;
• determining whether the output data matches the input data in accordance with predetermined criteria;
• changing a timing characteristic of the second clock signal until the output data fails to meet the predetermined criteria with respect to the input data;
• and
• deriving the second clock signal from the first clock signal prior to the step of propagating the second clock signal to the integrated circuit device, and wherein an amplitude characteristic of the second clock signal is adjusted with respect to a corresponding amplitude characteristic of the first clock signal.