Application of external voltage during array VT testing
AssigneesAdvanced Micro Devices, Inc., Fujitsu Limited
InventorsColin S. Bill, Edward V. Bautista, Jr., Shigekazu Yamada
Life of this patent
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Abstract
When an array VT test mode is entered, a predetermined wordline voltage is generated by a wordline voltage supply and supplied to at least one decoder circuit and a voltage control logic circuit. The voltage control logic circuit generates a predetermined control voltage that is directed to the decoder circuits. The predetermined control voltage activates the decoder circuits. A particular decoder circuit is electrically selected to decode at least one respective wordline and transfer the predetermined wordline voltage to the respective wordline. The activated decoder circuits that are not electrically selected are not forward-biased.
Claims24
A method of supplying voltage to a plurality of wordlines in a memory device, comprising the steps of:
- generating a predetermined wordline voltage with a wordline voltage supply;
- supplying said predetermined wordline voltage to at least one decoder circuit;
- and
- activating said decoder circuit with a predetermined control voltage generated by a voltage control logic circuit to transfer said predetermined wordline voltage to at least one wordline during array VT testing.
A method of decoding wordlines in a memory device, comprising the steps of:
- entering an array VT test mode;
- generating a predetermined wordline voltage with a wordline voltage supply;
- activating a voltage control logic circuit to generate a predetermined control voltage;
- and
- transferring said predetermined wordline voltage to at least one wordline decoded by at least one decoder circuit activated by said predetermined control voltage.
A wordline decoding system to transfer voltage to wordlines in a memory device, comprising:
- a wordline voltage supply to generate a predetermined wordline voltage;
- at least one decoder circuit electrically connected with said wordline voltage supply and at least one wordline, wherein said decoder circuit transfers said predetermined wordline voltage to said wordline;
- and
- a voltage control logic circuit electrically connected with said wordline voltage supply and said decoder circuit, wherein said voltage control logic circuit activates said decoder circuit with a predetermined control voltage during array VT testing.
Dependencies are inferred from the claim text.