Semiconductor integrated circuit device, memory module, storage device and the method for repairing semiconductor integrated circuit device
AssigneeHitachi, Ltd.
InventorsMitsuru Hiraki, Shoji Shukuri
Life of this patent
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AssigneeHitachi, Ltd.
InventorsMitsuru Hiraki, Shoji Shukuri
Estimating the term…
To improve the efficiency for repairing a defect of a large-scale integrated circuit. A semiconductor integrated circuit device comprises, a central processing unit (10), an electrically reprogrammable nonvolatile memory (11) and a volatile memory (12, 13) while sharing a dat bus (16), and utilizes the stored information of the nonvolatile memory so as to repair a defect of the volatile memory. This volatile memory includes volatile storage circuit (12AR, 13AR) for latching the repair information for repairing a defective normal memory cell with a redundancy memory cell. The nonvolatile memory reads out the repair information from itself in response to an instruction to initialize the semiconductor integrated circuit device. In response to the initializing instruction, the volatile storage circuit latches the repair information from the nonvolatile memory. Any fuse program circuit is not needed for the detect repair, but a defect to occur after a burn-in can be newly repaired so that the new defect can be repaired even after the packaging over a circuit substrate.
A semiconductor integrated circuit device comprising, over one semiconductor substrate while sharing a data bus:
Dependencies are inferred from the claim text.