Semiconductor device with external pins

Abstract

In a high-speed SDRAM, a contact resistance detecting circuit is provided for detecting a contact resistance value between a socket and an external pin. At the time of testing, the contact resistance detecting circuit compares a current flowing from the socket supplied with a power supply potential through the external pin to a first transistor and a constant current flowing from a line of the power supply potential to a second transistor, and, based on the comparison result, outputs a signal of a level corresponding to the contact resistance value.

Dependencies are inferred from the claim text.