Built-in self test for integrated digital-to-analog converters
AssigneeKoninklijke Philips Electronics N.V.
InventorJean-Yves Michel
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AssigneeKoninklijke Philips Electronics N.V.
InventorJean-Yves Michel
Estimating the term…
A circuit arrangement and method for testing the differential non-linearity (DNL) of a digital-to-analog converter (DAC) determines whether the digital-to-analog converter has an analog output that is monotonic, and thus the DAC is functional The design is appropriate for being implemented on an integrated circuit containing a digital-to-analog converter, creating an efficient self-test circuit arrangement. A counter generates a monotonic sequence of digital input codes for a digital input of the digital-to-analog converter. A monotonicity comparator, such as a one-stage or multistage sample and hold circuit arrangement, detects any non-monotonic transition in the analog output of the digital-to-analog converter, generating an error signal as an output. An output switch, such as a digital flip-flop, may be set by the error signal, for monitoring by other devices. A clock signal synchronizes the counter and the monotonicity comparator. A reset signal may be included to reset the counter to the first digital input code in the sequence, The reset may also reset the output switch.
A test circuit arrangement for testing a digital-to-analog converter having a digital input and an analog output, the test circuit arrangement comprising:
An integrated circuit including a digital-to-analog converter and a self-test circuit arrangement, the digital-to-analog converter including a digital input and an analog output, the self-test circuit arrangement comprising:
A method for testing a digital-to-analog converter included in an integrated circuit, the digital-to-analog converter including a digital input and an analog output, the method comprising:
Dependencies are inferred from the claim text.