Probe for fault actuation devices
AssigneeCSELT - Centro Studi e Laboratori Telecomunicazioni S.p.A.
InventorsPiero Belforte, Flavio Maggioni
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Abstract
A probe for fault-actuation devices has a transistor which is utilized to insert a reference signal into a fault-insertion point. The emitter and collector are connectable to the fault-insertion point and a reference signal and a capacitor with a capacitance greater than the capacitance of parasitic components is connected between the base and the emitter.
Claims12
A probe for fault actuation devices, arranged to force a test point of electronic equipment under test to a given signal level, the probe comprising a transistor having a control electrode and two circuit terminals which circuit terminals are connectable respectively to said test point and to said given signal level and means acting on the control electrode of the transistor for selectively switching the transistor between a cutoff condition and a conducting condition, the transistor in conducting condition being driven into saturation, causing said test point to be forced to said given signal level and a capacitor directly connected between the control electrode and a circuit terminal of the transistor opposite to said test point, which capacitor has substantially higher capacitance value than a value of parasitic capacitance existing between the control electrode and the circuit terminal of the transistor coupled to the test point.
Dependencies are inferred from the claim text.