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AssigneeRaytheon Company
InventorsChing-ju Jennifer Young, Kent McCormack, Larry A. Turner
Estimating the term…
Improved methods of calculating offset correction values for detector elements of an infrared detector array. The methods can be used for one-dimensional scanning arrays, and performed twice for two-dimensional staring arrays. (FIGS. 3 and 6). The array is dithered so that two or more neighboring detector elements of the array look at the same location of a scene. (FIG. 3, Step 302). Then, two fields of pixel data are processed to calculate an offset correction value for each detector element. (FIG. 3, Steps 305, 309, and 311). For each detector element, its offset error is calculated from local averages, with the local average for a particular detector element including a term for that detector element as well as terms for a neighboring detector element. A “one-step” method uses the sum of “shifted image differences” from two fields. A “scene term” may be added to each offset correction value to compensate for dither bias.
A one-step method of calculating offset correction values to compensate offset errors of detector elements of an infrared detector array, where each detector element of the array has at least one neighbor, comprising the steps of:
A method of calculating dither bias compensation values to apply to offset correction values to compensate offset errors of detector elements of an infrared detector array, where each detector element of the array has at least one neighbor, and where the array is dithered with a dither bias, comprising the steps of:
Dependencies are inferred from the claim text.