Semiconductor device having metal silicide film and manufacturing method thereof
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsToshiaki Iwamatsu, Yasuo Inoue, Yasuo Yamaguchi, Tadashi Nishimura
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Abstract
A semiconductor device in which parasitic resistance of source/drain regions can be reduced than the parasitic resistance of the drain region, and manufacturing method thereof, can be obtained. In the semiconductor device, inactivating ions are implanted only to the source region of the semiconductor layer, so as to damage the crystal near the surface of the semiconductor layer, whereby siliciding reaction is promoted. Therefore, in the source region, a titanium silicide film which is thicker can be formed.
Claims4
A method of manufacturing a semiconductor device, comprising the steps of:
- implanting electrically inactivating ions from above a semiconductor layer by rotary oblique implantation;
- after implantation of said electrically inactivating ions, forming a metal layer on said semiconductor layer;
- forming a metal silicide film by causing reaction between said semiconductor layer and said metal layer;
- and
- forming source/drain regions by implanting, after formation of said metal silicide film, impurity ions of a first conductivity type from above said metal silicide film.
A method of manufacturing a semiconductor device comprising the steps of:
- implanting electrically inactivating ions from above a semiconductor layer;
- after implantation of said electrically inactivating ions, forming a metal layer on said semiconductor layer having intended source/drain regions;
- masking a portion of said metal layer overlying said intended drain region;
- ion implanting said electrically inactivating ions into an exposed portion of said metal layer to cause mixing at an interface of said metal layer and said intended drain region;
- unmasking the portion of said metal layer overlying said intended drain region;
- annealing to form metal silicide films, by causing reaction between said semiconductor layer and said metal layer, on the source/drain regions, wherein said metal silicide film formed on said intended source region has a thickness greater than a thickness of said meal silicide film formed on said intended drain region;
- and
- forming source/drain regions by implanting, after formation of said metal silicide film, impurity ions of a first conductivity type from above said metal silicide film.
Dependencies are inferred from the claim text.